BS-EN-60068-2-82 › Environmental testing. Tests. Test Tx. Whisker test methods for electronic and electric components
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Printed-circuit boards, Elongation, Crystal growth, Tin, Surface defects, Electrical equipment, Finishes, Solders, Electronic equipment and components, Environmental testing, Testing conditions, Test equipment, Tin alloys, Electrical components, Dimensional changes
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BS EN 60068-2-82:2007
July 31, 2007
EN 60068-2-82:2007 IEC 60068-2-82:2007