BS-EN-60749 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749 - 1999 EDITION - SUPERSEDED -- See the following: BS-EN-60749-1 BS-EN-60749-10 BS-EN-60749-11 BS-EN-60749-12 BS-EN-60749-13 BS-EN-60749-14 BS-EN-60749-15 BS-EN-60749-16 BS-EN-60749-17 BS-EN-60749-18 BS-EN-60749-19 BS-EN-60749-2 BS-EN-60749-20 BS-EN-60749-21 BS-EN-60749-22 BS-EN-60749-25 BS-EN-60749-26 BS-EN-60749-27 BS-EN-60749-3 BS-EN-60749-31 BS-EN-60749-32 BS-EN-60749-36 BS-EN-60749-39 BS-EN-60749-4 BS-EN-60749-5 BS-EN-60749-6 BS-EN-60749-7 BS-EN-60749-8 BS-EN-60749-9
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Semiconductor devices. Mechanical and climatic test methods

Keywords

Integrated circuits;Solderability testing;Strength of materials;Dimensional measurement;Classification systems;Specimen preparation;Accelerated testing;Pull-out tests;Mass spectrometry;Mechanical testing;Thermal-shock tests;Storage;Electrical testing;Visual inspection (testing);Torsion testing;Low-pressure tests;Defects;Endurance testing;Test equipment;Test specimens;Electric terminals;Temperature measurement;Environmental testing;Marking;Shear testing;Leak tests;Electronic equipment and components;Bonding;Stress;Moisture measurement;Vibration testing;Radioactive tracer methods;Thermal testing;Semiconductor devices;Fire tests;Damp-heat tests;Flammability;Testing conditions

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS EN 60749:1999

Revision Level

1999 EDITION

Status

Superseded

Publication Date

Sept. 23, 2002

Replaces

BS 6493-3:1985

Replaced By

BS EN 60749-1:2003;BS EN 60749-8:2003;BS EN 60749-5:2003;BS EN 60749-32:2003+A1:2010;BS EN 60749-31:2003;BS EN 60749-22:2003;BS EN 60749-20:2003;BS EN 60335-2-11:2001

Replaced by Notes

BS EN 60749-14:2003;BS EN 60749-21:2005;BS EN 60749-9:2002;BS EN 60749-26:2006;BS EN 60749-10:2002;BS EN 60749-13:2002;BS EN 60749-27:2006+A1:2012;BS EN 60749-2:2002;BS EN 60749-15:2003;BS EN 60749-3:2002;BS EN 60749-12:2002;BS EN 60749-11:2002;BS EN 60749-7:2002;BS EN 60749-5:2003;BS EN 60749-6:2002;BS EN 60749-39:2006;BS EN 60749-25:2003;BS EN 60749-19:2003+A1:2010;BS EN 60749-36:2003;BS EN 60749-4:2002

Page Count

80

ISBN

0580321517

International Equivalent

EN 60749/A2 (IEC 60749/A2:2001 AS);IEC 60749:1996/AMD2:2001

Committee Number

EPL/47