BS-EN-60749-11 Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-11 - 2002 EDITION - CURRENT


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 2002 EDITION - Sept. 24, 2002
 AMD 14681 - Oct. 24, 2003

Keywords

Environmental testing;Integrated circuits;Mechanical testing;Temperature measurement;Electronic equipment and components;Destructive testing;Temperature;Semiconductor devices;Climate;Thermal testing

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31.080.01 (Semiconductor devices in general)

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Document Number

BS EN 60749-11:2002

Revision Level

2002 EDITION

Status

Current

Publication Date

Oct. 24, 2003

Replaces Notes

BS EN 60749:1999

Page Count

12

ISBN

0580403955

International Equivalent

IEC 60749-11:2002;EN 60749-11 (IEC 60749-11:2002) AS

Committee Number

EPL/47