BS-EN-60749-19 Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-19 - 2003 EDITION - CURRENT


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 2003 EDITION - June 20, 2003
 2003 EDITION AMENDMENT 1 - Oct. 1, 2010

Keywords

Integrated circuits,Substrates (insulating),Quality control,Environmental testing,Strength of materials,Semiconductor devices,Shear testing,Shear strength,Electrical components,Climate,Mechanical testing,Electrical equipment,Electronic equipment and components

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31.080.01 (Semiconductor devices in general)

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Document Number

BS EN 60749-19:2003+A1:2010

Revision Level

2003 EDITION

Status

Current

Publication Date

Oct. 31, 2010

Replaces Notes

BS EN 60749:1999

Page Count

10

ISBN

9780580687457

International Equivalent

EN 60749-19:2003/A1:2010 IEC 60749-19:2003/AMD1:2010

Committee Number

EPL/47