BS-EN-60749-19 › Semiconductor devices. Mechanical and climatic test methods
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2003 EDITION AMENDMENT 1 - Oct. 1, 2010
Integrated circuits,Substrates (insulating),Quality control,Environmental testing,Strength of materials,Semiconductor devices,Shear testing,Shear strength,Electrical components,Climate,Mechanical testing,Electrical equipment,Electronic equipment and components
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BS EN 60749-19:2003+A1:2010
Oct. 31, 2010
BS EN 60749:1999
EN 60749-19:2003/A1:2010 IEC 60749-19:2003/AMD1:2010