BS-EN-60749-20 › Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-20 - 2009 EDITION - SUPERSEDED
Show Complete Document History

Document Center Inc. is an authorized dealer of BSI standards.
The following bibliographic material is provided to assist you with your purchasing decision:

Semiconductor devices. Mechanical and climatic test methods

Keywords

Plastics;Climate;Thermal testing;Encapsulated;Surface mounting devices;Damp-heat tests;Environmental testing;Electronic equipment and components;Semiconductor devices;Integrated circuits;Soldering;Solderability testing;Mechanical testing

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

ORDER

Want this as a site license?



Document Number

BS EN 60749-20:2009

Revision Level

2009 EDITION

Status

Superseded

Publication Date

Jan. 31, 2010

Replaces

BS EN 60749-20:2003

Replaced By

BS EN IEC 60749-20:2020

Page Count

32

ISBN

9780580594786

International Equivalent

EN 60749-20:2009;IEC 62298-3:2005;EN 62298-3:2005;IEC 60749-20:2008

Committee Number

EPL/47