BS-EN-60749-24 Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-24 - 2004 EDITION - CURRENT


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Semiconductor devices. Mechanical and climatic test methods

Keywords

Solid-state physics;Accelerated testing;Mechanical testing;Semiconductor devices;Accelerated corrosion tests;Moisture measurement;Climate;Temperature;Humidity;Performance testing;Corrosion resistance;Destructive testing;Electronic equipment and components;Damp-heat tests;Reliability;Environmental testing;Integrated circuits;Testing conditions

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31.080.01 (Semiconductor devices in general)

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Document Number

BS EN 60749-24:2004

Revision Level

2004 EDITION

Status

Current

Publication Date

June 24, 2004

Page Count

10

ISBN

0580439720

International Equivalent

IEC 60749-24:2004;EN 60749-24:2004

Committee Number

EPL/47