BS-EN-60749-26 Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-26 - 2014 EDITION - SUPERSEDED -- See the following: BS-EN-IEC-60749-26
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Semiconductor devices. Mechanical and climatic test methods

Keywords

Degradation,Integrated circuits,Human body,Climate,Grades (quality),Test models,Electrostatics,Electrical testing,Electronic equipment and components,Environmental testing,Sensitivity,Mechanical testing,Damage,Classification systems,Semiconductor devices

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS EN 60749-26:2014

Revision Level

2014 EDITION

Status

Superseded

Publication Date

June 30, 2014

Replaces

BS EN 60749-26:2006

Replaced By

BS EN IEC 60749-26:2018

Page Count

44

ISBN

9780580760990

International Equivalent

IEC 60749-26:2013 EN 60749-26 (IEC 60749-26:2013) AS

Committee Number

EPL/47