BS-EN-60749-26 › Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
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Semiconductor devices, Classification systems, Damage, Mechanical testing, Sensitivity, Environmental testing, Electronic equipment and components, Electrical testing, Electrostatics, Test models, Grades (quality), Climate, Human body, Integrated circuits, Degradation
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BS EN 60749-26:2014
June 30, 2014
BS EN 60749-26:2006
EN 60749-26 (IEC 60749-26:2013 IEC 60749-26:2013