BS-EN-60749-26 Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

BS-EN-60749-26 - 2014 EDITION - SUPERSEDED -- See the following: BS-EN-IEC-60749-26
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Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

Keywords

Semiconductor devices, Classification systems, Damage, Mechanical testing, Sensitivity, Environmental testing, Electronic equipment and components, Electrical testing, Electrostatics, Test models, Grades (quality), Climate, Human body, Integrated circuits, Degradation

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31.080.01 (Semiconductor devices in general)

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Document Number

BS EN 60749-26:2014

Revision Level

2014 EDITION

Status

Superseded

Publication Date

June 30, 2014

Replaces

BS EN 60749-26:2006

Page Count

42

ISBN

9780580760990

International Equivalent

EN 60749-26 (IEC 60749-26:2013 IEC 60749-26:2013

Committee Number

EPL/47