BS-EN-60749-27 Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-27 - 2006/A1 EDITION - CURRENT
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Semiconductor devices. Mechanical and climatic test methods

Keywords

Electrical testing,Grades (quality),Sensitivity,Damage,Semiconductor devices,Classification systems,Electronic equipment and components,Test models,Mechanical testing,Electrostatics,Integrated circuits,Degradation,Climate,Environmental testing

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS EN 60749-27:2006:2012

Revision Level

2006/A1 EDITION

Status

Current

Publication Date

Jan. 31, 2013

Replaces Notes

BS EN 60749:1999

Page Count

16

ISBN

9780580766084

International Equivalent

IEC 60749-27:2006/AMD1:2012 EN 60749-27:2006/A1:2012

Committee Number

EPL/47