BS-EN-60749-29 Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-29 - 2011 EDITION - CURRENT
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Semiconductor devices. Mechanical and climatic test methods

Keywords

Climate;Electrical testing;Overvoltage;Destructive testing;Failure rate;Environmental testing;Overvoltage tests;Mechanical testing;Electronic equipment and components;Integrated circuits;Semiconductor devices;Electrical faults;Electrical impedance

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS EN 60749-29:2011

Revision Level

2011 EDITION

Status

Current

Publication Date

Aug. 31, 2011

Replaces

BS EN 60749-29:2003;BS EN 60749-29:2003

Page Count

26

ISBN

9780580691386

International Equivalent

IEC 60749-29:2011;EN 60749-29:2011

Committee Number

EPL/47