BS-EN-60749-29 Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-29 - 2011 EDITION - CURRENT
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Semiconductor devices. Mechanical and climatic test methods

Keywords

Climate,Electrical testing,Overvoltage,Destructive testing,Failure rate,Environmental testing,Overvoltage tests,Mechanical testing,Electronic equipment and components,Integrated circuits,Semiconductor devices,Electrical faults,Electrical impedance

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS EN 60749-29:2011

Revision Level

2011 EDITION

Status

Current

Publication Date

Aug. 31, 2011

Replaces

BS EN 60749-29:2003 BS EN 60749-29:2003

Page Count

26

ISBN

9780580691386

International Equivalent

IEC 60749-29:2011 EN 60749-29:2011

Committee Number

EPL/47