BS-EN-60749-34 › Semiconductor devices. Mechanical and climatic test methods
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Destructive testing;Environmental testing;Integrated circuits;Stress;Low voltage;Climate;Electronic equipment and components;Mechanical testing;Thermal stress;Power losses;Electrical testing;Stress analysis;Semiconductor devices
To find similar documents by classification:
31.080 (Semiconductor devices Semiconducting materials, see 29.045)
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Document Number
BS EN 60749-34:2010
Revision Level
2010 EDITION
Status
Current
Publication Date
Feb. 28, 2011
Replaces
BS EN 60749-34:2004
Page Count
14
ISBN
9780580691645
International Equivalent
EN 60749-34:2010;IEC 60749-34:2010
Committee Number
EPL/47