BS-EN-60749-38 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-60749-38
-
2008 EDITION
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CURRENT
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Errors;Environmental testing;Electronic equipment and components;Computer storage devices;Semiconductor devices;Mechanical testing;Integrated circuits;Alpha particles
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 60749-38:2008
Revision Level
2008 EDITION
Status
Current
Publication Date
June 30, 2008
Page Count
16
ISBN
9780580548758
International Equivalent
IEC 60749-38:2008;EN 60749-38:2008
Committee Number
EPL/47