BS-EN-60749-42 Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-42 - 2014 EDITION - CURRENT


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Semiconductor devices. Mechanical and climatic test methods

Keywords

Mechanical testing,Testing conditions,Climate,Integrated circuits,Semiconductor devices,Electronic equipment and components,Environmental testing

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS EN 60749-42:2014

Revision Level

2014 EDITION

Status

Current

Publication Date

Oct. 31, 2014

Page Count

12

ISBN

9780580790911

International Equivalent

IEC 60749-42:2014 EN 60749-42 (IEC 60749-42:2014) AS

Committee Number

EPL/47