BS-EN-60749-42 › Semiconductor devices. Mechanical and climatic test methods. Temperature and humidity storage
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Mechanical testing, Testing conditions, Climate, Integrated circuits, Semiconductor devices, Electronic equipment and components, Environmental testing
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BS EN 60749-42:2014
Oct. 31, 2014
EN 60749-42 (IEC 60749-42:2014 IEC 60749-42:2014