BS-EN-60749-42 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-60749-42
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2014 EDITION
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CURRENT
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Mechanical testing;Testing conditions;Climate;Integrated circuits;Semiconductor devices;Electronic equipment and components;Environmental testing
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN 60749-42:2014
Revision Level
2014 EDITION
Status
Current
Publication Date
Oct. 31, 2014
Page Count
12
ISBN
9780580790911
International Equivalent
IEC 60749-42:2014;EN 60749-42:2014
Committee Number
EPL/47