BS-EN-60749-44 Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-44 - 2016 EDITION - CURRENT


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Semiconductor devices. Mechanical and climatic test methods

Keywords

Water vapour,Water-vapour tests,Climate,Gas analysis,Integrated circuits,Semiconductor devices,Moisture measurement,Environmental testing,Mechanical testing,Electronic equipment and components

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31.080.01 (Semiconductor devices in general)

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Document Number

BS EN 60749-44:2016

Revision Level

2016 EDITION

Status

Current

Publication Date

Nov. 30, 2016

Page Count

26

ISBN

9780580862038

International Equivalent

IEC 60749-44:2016 EN 60749-44:2016

Committee Number

EPL/47