BS-EN-60749-44 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-60749-44
-
2016 EDITION
-
CURRENT
Document Center Inc. is an authorized dealer of BSI standards.
The following bibliographic material is provided to assist you with your purchasing decision:
The following bibliographic material is provided to assist you with your purchasing decision:
Semiconductor devices. Mechanical and climatic test methods
Keywords
Water vapour;Water-vapour tests;Climate;Gas analysis;Integrated circuits;Semiconductor devices;Moisture measurement;Environmental testing;Mechanical testing;Electronic equipment and components
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
This document comes with our free Notification Service, good for the life of the document.
This document is available in either Paper or PDF format.
Document Number
BS EN 60749-44:2016
Revision Level
2016 EDITION
Status
Current
Publication Date
Nov. 30, 2016
Page Count
26
ISBN
9780580862038
International Equivalent
IEC 60749-44:2016;EN 60749-44:2016
Committee Number
EPL/47