BS-EN-60749-6 Semiconductor devices. Mechanical and climatic test methods

BS-EN-60749-6 - 2017 EDITION - CURRENT
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Semiconductor devices. Mechanical and climatic test methods

Keywords

High temperatures;Electronic storage;Semiconductor devices;Semiconductor storage;Climate;Integrated circuits;Environmental testing;Electronic equipment and components;Mechanical testing

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS EN 60749-6:2017

Revision Level

2017 EDITION

Status

Current

Publication Date

Nov. 24, 2017

Replaces

BS EN 60749-6:2002

Page Count

12

ISBN

9780580948923

International Equivalent

EN 60749-6:2017;IEC 60749-6:2017

Committee Number

EPL/47