BS-EN-62047-15 › Semiconductor devices. Micro-electromechanical devices
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Thin films,Electronic equipment and components,Test specimens,Electromechanical devices,Axial stress,Semiconductor technology,Test equipment,Tensile testing,Semiconductor devices
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BS EN 62047-15:2015
July 31, 2015
EN 62047-15:2015 IEC 62047-15:2015