BS-EN-62047-17 › Semiconductor devices. Micro-electromechanical devices
BS-EN-62047-17
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2015 EDITION
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CURRENT
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Semiconductor devices. Micro-electromechanical devices
Keywords
Test specimens,Semiconductor technology,Electromechanical devices,Test equipment,Axial stress,Tensile testing,Semiconductor devices,Electronic equipment and components,Thin films
To find similar documents by classification:
31.080.99 (Other semiconductor devices)
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This document is available in Paper format.
Document Number
BS EN 62047-17:2015
Revision Level
2015 EDITION
Status
Current
Publication Date
July 31, 2015
Page Count
34
ISBN
9780580722035
International Equivalent
EN 62047-17 (IEC 62047-17:2015) AS IEC 62047-17:2015
Committee Number
EPL/47