BS-EN-62047-20 › Semiconductor devices. Micro-electromechanical devices. Gyroscopes
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Vibration, Integrated circuits, Test equipment, Electronic equipment and components, Electromechanical devices, Test specimens, Thin-film devices, Semiconductor technology, Fatigue testing, Semiconductor devices, Resonance, Bend testing
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BS EN 62047-20:2014
Oct. 31, 2014
EN 62047-20:2014 IEC 62047-20:2014