BS-EN-62047-21 › Semiconductor devices. Micro-electromechanical devices
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Vibration,Semiconductor technology,Fatigue testing,Test specimens,Semiconductor devices,Resonance,Electronic equipment and components,Test equipment,Thin-film devices,Bend testing,Electromechanical devices,Integrated circuits
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BS EN 62047-21:2014
Oct. 31, 2014
EN 62047-21 (IEC 62047-21:2014) AS IEC 62047-21:2014