BS-EN-62047-21 Semiconductor devices. Micro-electromechanical devices

BS-EN-62047-21 - 2014 EDITION - CURRENT


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Semiconductor devices. Micro-electromechanical devices

Keywords

Vibration,Semiconductor technology,Fatigue testing,Test specimens,Semiconductor devices,Resonance,Electronic equipment and components,Test equipment,Thin-film devices,Bend testing,Electromechanical devices,Integrated circuits

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31.080.99 (Other semiconductor devices)

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Document Number

BS EN 62047-21:2014

Revision Level

2014 EDITION

Status

Current

Publication Date

Oct. 31, 2014

Page Count

18

ISBN

9780580775543

International Equivalent

EN 62047-21 (IEC 62047-21:2014) AS IEC 62047-21:2014

Committee Number

EPL/47