BS-EN-62047-22 › Semiconductor devices. Micro-electromechanical devices. Electromechanical tensile test method for conductive thin films on flexible substrates
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Vibration, Bend testing, Test specimens, Integrated circuits, Resonance, Fatigue testing, Test equipment, Electronic equipment and components, Electromechanical devices, Semiconductor devices, Semiconductor technology, Thin-film devices
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BS EN 62047-22:2014
Oct. 31, 2014
EN 62047-22:2014 IEC 62047-22:2014