BS-EN-62047-22 Semiconductor devices. Micro-electromechanical devices. Electromechanical tensile test method for conductive thin films on flexible substrates

BS-EN-62047-22 - 2014 EDITION - CURRENT


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Semiconductor devices. Micro-electromechanical devices. Electromechanical tensile test method for conductive thin films on flexible substrates

Keywords

Vibration, Bend testing, Test specimens, Integrated circuits, Resonance, Fatigue testing, Test equipment, Electronic equipment and components, Electromechanical devices, Semiconductor devices, Semiconductor technology, Thin-film devices

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Document Number

BS EN 62047-22:2014

Revision Level

2014 EDITION

Status

Current

Publication Date

Oct. 31, 2014

Page Count

12

ISBN

9780580775550

International Equivalent

EN 62047-22:2014 IEC 62047-22:2014

Committee Number

EPL/47