BS-EN-62373 › Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

BS-EN-62373 - 2006 EDITION - CURRENT


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Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Keywords

Semiconductors;Semiconductor devices;Testing conditions;Transistors;Metal oxide semiconductors;Temperature;Voltage measurement;Electronic equipment and components

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31.080.30 (Transistors)

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Document Number

BS EN 62373:2006

Revision Level

2006 EDITION

Status

Current

Publication Date

Sept. 29, 2006

Page Count

16

ISBN

0580492559

International Equivalent

EN 62373:2006;IEC 62373:2006;EN 50289-3-7:2001

Committee Number

EPL/47