BS-EN-62374-1 Semiconductor devices

BS-EN-62374-1 - 2010 EDITION - CURRENT


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 2010 EDITION - Dec. 31, 2010
 2010 EDITION CORRIGENDUM 1 - June 1, 2011

Keywords

Electrical measurement;Semiconductors;Dielectric breakdown;Life (durability);Testing conditions;Semiconductor devices;Films (states of matter)

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS EN 62374-1:2010

Revision Level

2010 EDITION

Status

Current

Publication Date

June 30, 2011

Page Count

20

ISBN

9780580752063

International Equivalent

EN 62374-1:2010/AC:2011;IEC 60809:2014/AMD1:2017

Committee Number

EPL/47