BS-EN-62374 › Historical Revision Information
Semiconductor Devices. Time Dependent Dielectric Breakdown (Tddb) Test for Gate Dielectric Films

BS-EN-62374 - REPLACED BY BS-EN-62374-1 - SUPERSEDED -- See the following: BS-EN-62374-1
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Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Keywords

Mathematical calculations;Electrical measurement;Semiconductor devices;Testing conditions;Semiconductors;Films (states of matter);Dielectric breakdown;Life (durability)

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS-EN-62374

Revision Level

REPLACED BY BS-EN-62374-1

Status

Superseded

Publication Date

Dec. 31, 2010

International Equivalent

IEC 62374:2007;EN 62374:2007

Committee Number

EPL/47