BS-EN-IEC-60749-20 › Semiconductor devices. Mechanical and climatic test methods
BS-EN-IEC-60749-20
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2020 EDITION
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CURRENT
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Plastics;Climate;Thermal testing;Encapsulated;Surface mounting devices;Damp-heat tests;Environmental testing;Electronic equipment and components;Semiconductor devices;Integrated circuits;Soldering;Solderability testing;Mechanical testing
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
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Document Number
BS EN IEC 60749-20:2020
Revision Level
2020 EDITION
Status
Current
Publication Date
Oct. 14, 2020
Replaces
BS EN 60749-20:2009
Page Count
32
ISBN
9780539045840
International Equivalent
EN 60749-20 Ed.3.0;IEC 60749-20 Ed.3.0
Committee Number
EPL/47