BS-EN-IEC-60749-26 Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

BS-EN-IEC-60749-26 - 2018 EDITION - CURRENT


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Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

Keywords

Semiconductor devices, Electronic equipment and components, Degradation, Sensitivity, Climate, Integrated circuits, Electrostatics, Environmental testing, Human body, Test models, Grades (quality), Mechanical testing, Damage, Electrical testing, Classification systems

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS EN IEC 60749-26:2018

Revision Level

2018 EDITION

Status

Current

Publication Date

April 30, 2018

Replaces

BS EN 60749-26:2014

Page Count

56

ISBN

9780580976049

International Equivalent

EN IEC 60749-26:2018 IEC 60749-26:2018

Committee Number

EPL/47