BS-EN-IEC-60749-26-TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods

BS-EN-IEC-60749-26-TC - 2018 EDITION - CURRENT


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Tracked Changes. Semiconductor devices. Mechanical and climatic test methods

Keywords

Classification systems;Electrical testing;Damage;Mechanical testing;Grades (quality);Test models;Human body;Environmental testing;Electrostatics;Integrated circuits;Climate;Sensitivity;Degradation;Electronic equipment and components;Semiconductor devices

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS EN IEC 60749-26:2018 - TC

Revision Level

2018 EDITION

Status

Current

Publication Date

Feb. 27, 2020

ISBN

9780539117264

Committee Number

EPL/47