BS-EN-IEC-60749-28 Semiconductor devices. Mechanical and climatic test methods

BS-EN-IEC-60749-28 - 2022 EDITION - CURRENT


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Semiconductor devices. Mechanical and climatic test methods

Keywords

Electrostatics;Electric charge;Electronic equipment and components;Electric discharges;Mechanical testing;Semiconductor devices;Test methods;Environmental testing;Integrated circuits

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS EN IEC 60749-28:2022

Revision Level

2022 EDITION

Status

Current

Publication Date

Sept. 6, 2022

Replaces

BS EN 60749-28:2017

Page Count

54

ISBN

9780539136579

International Equivalent

EN 60749-28 Ed.2.0;IEC 60749-28 Ed.2.0

Committee Number

EPL/47