BS-EN-IEC-63287-1 › Semiconductor devices. Generic semiconductor qualification guidelines

BS-EN-IEC-63287-1 - 2021 EDITION - CURRENT


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Semiconductor devices. Generic semiconductor qualification guidelines

Keywords

Semiconductor devices;Reliability;Electrical failure;Tests;Test methods

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

BS EN IEC 63287-1:2021

Revision Level

2021 EDITION

Status

Current

Publication Date

Nov. 30, 2021

Replaces

BS EN 60749-43:2017

Page Count

50

ISBN

9780539127232

International Equivalent

IEC 63287-1:202;EN 63287-1 Ed.1.0;ERROR

Committee Number

EPL/47