BS-IEC-60747-1 Semiconductor devices

BS-IEC-60747-1 - 2006 EDITION - CURRENT


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Included in this current edition are the following subparts:

 2006 EDITION - June 30, 2006
 AMD 16573 - Aug. 1, 2006
 2006 EDITION CORRIGENDUM 2 - June 1, 2009
 2006 EDITION AMENDMENT 1 - July 1, 2010

Keywords

Colour codes;Endurance testing;Terminology;Electrical measurement;Letters (symbols);Measurement;Acceptance (approval);Reliability;Electrical testing;Semiconductor devices;Electric terminals;Testing conditions;Symbols;Graphic symbols;Marking;Sensitivity;Ratings;Electrostatics;Integrated circuits;Position;Identification methods;Storage;Labels;Electronic equipment and components

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31.080.01 (Semiconductor devices in general)

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Document Number

BS IEC 60747-1:2006+A1:2010

Revision Level

2006 EDITION

Status

Current

Publication Date

July 31, 2010

Replaces

BS 6493-1.1:1984

Page Count

46

ISBN

9780580682179

International Equivalent

IEC 60747-1:2006/AMD1:2010

Committee Number

EPL/47