BS-IEC-62526 › Standard for extensions to standard test interface language (STIL) for semiconductor design environments
BS-IEC-62526
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2007 EDITION
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CURRENT
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Standard for extensions to standard test interface language (STIL) for semiconductor design environments
Keywords
Information exchange;Automatic;Data transfer;Test equipment;Data representation;Interfaces (data processing);Computer applications;Simulation;Data processing;Programming languages;Semiconductor devices
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Document Number
BS IEC 62526:2007
Revision Level
2007 EDITION
Status
Current
Publication Date
Dec. 31, 2007
Page Count
124
ISBN
9780580593147
International Equivalent
IEC 62526:2007
Committee Number
EPL/501