BS-IEC-62528 › Standard testability method for embedded core-based integrated circuits

BS-IEC-62528 - 2007 EDITION - CURRENT


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Standard testability method for embedded core-based integrated circuits

Keywords

Testing;Electronic engineering;Computer circuits;Microprocessor chips;Electronic equipment and components;Computer hardware;Integrated circuits

To find similar documents by classification:

31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

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Document Number

BS IEC 62528:2007

Revision Level

2007 EDITION

Status

Current

Publication Date

Dec. 31, 2007

Page Count

126

ISBN

9780580593185

International Equivalent

IEC 62528:2007

Committee Number

EPL/501