BS-ISO-16531 › Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
Document Center Inc. is an authorized dealer of BSI standards.
The following bibliographic material is provided to assist you with your purchasing decision:
The following bibliographic material is provided to assist you with your purchasing decision:
Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
Keywords
Surfaces;Surface chemistry;Optical measurement;Chemical composition;Glow discharges;Quantitative analysis;Spectroscopy;Chemical analysis and testing;Thickness;Mass
To find similar documents by classification:
71.040.40 (Chemical analysis Including analysis of gases and surface chemical analysis)
This document comes with our free Notification Service, good for the life of the document.
This document is available in either Paper or PDF format.
Document Number
BS ISO 16531:2020
Revision Level
2020 EDITION
Status
Current
Publication Date
Oct. 6, 2020
Replaces
BS ISO 16531:2013
Page Count
28
ISBN
9780539057850
International Equivalent
ISO 16531
Committee Number
CII/60