BS-ISO-16700 › Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
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Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
Keywords
Calibration;Magnification;Electron optics;Electron microscopes;Microscopes;Optical instruments;Scanning electron microscopes;Control samples;Optical phenomena;Accuracy;Electron beams
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Document Number
BS ISO 16700:2016
Revision Level
2016 EDITION
Status
Current
Publication Date
July 31, 2016
Replaces
BS ISO 16700:2004
Page Count
30
ISBN
9780580890529
International Equivalent
ISO 16700:2016
Committee Number
CII/9