BS-ISO-16700 › Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
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Calibration,Magnification,Electron optics,Electron microscopes,Microscopes,Optical instruments,Scanning electron microscopes,Control samples,Optical phenomena,Accuracy,Electron beams
To find similar documents by classification:
37.020 (Optical equipment Including microscopes, telescopes, binoculars, optical materials, optical components and optical systems Ophthalmic equipment, see 11.040.70 Optical measuring instruments, see 17.180.30 Photographic equipment lenses, see 37.040.10)
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BS ISO 16700:2016
July 31, 2016
BS ISO 16700:2004