BS-ISO-16700 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

BS-ISO-16700 - 2016 EDITION - CURRENT
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Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

Keywords

Scanning electron microscopes, Electron microscopes, Microscopes, Optical instruments, Electron optics, Electron beams, Magnification, Optical phenomena, Calibration, Control samples, Accuracy

To find similar documents by classification:

37.020 (Optical equipment Including microscopes, telescopes, binoculars, optical materials, optical components and optical systems Ophthalmic equipment, see 11.040.70 Optical measuring instruments, see 17.180.30 Photographic equipment lenses, see 37.040.10)

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Document Number

BS ISO 16700:2016

Revision Level

2016 EDITION

Status

Current

Publication Date

July 31, 2016

Replaces

BS ISO 16700:2004

Page Count

30

ISBN

9780580890529

International Equivalent

ISO 16700:2016

Committee Number

CII/9