BS-ISO-16700 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

BS-ISO-16700 - 2016 EDITION - CURRENT
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Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

Keywords

Calibration;Magnification;Electron optics;Electron microscopes;Microscopes;Optical instruments;Scanning electron microscopes;Control samples;Optical phenomena;Accuracy;Electron beams

To find similar documents by classification:

37.020 (Optical equipment Including microscopes, telescopes, binoculars, optical materials, optical components and optical systems Ophthalmic equipment, see 11.040.70 Optical measuring instruments, see 17.180.30 Photographic equipment lenses, see 37.040.10)

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Document Number

BS ISO 16700:2016

Revision Level

2016 EDITION

Status

Current

Publication Date

July 31, 2016

Replaces

BS ISO 16700:2004

Page Count

30

ISBN

9780580890529

International Equivalent

ISO 16700:2016

Committee Number

CII/9