BS-ISO-16700-TC › Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
BS-ISO-16700-TC
-
2016 EDITION
-
CURRENT
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Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
Keywords
Calibration;Magnification;Electron optics;Electron microscopes;Microscopes;Optical instruments;Scanning electron microscopes;Control samples;Optical phenomena;Accuracy;Electron beams
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Document Number
BS ISO 16700:2016 - TC
Revision Level
2016 EDITION
Status
Current
Publication Date
Feb. 26, 2020
Page Count
58
ISBN
9780539107159
Committee Number
CII/9