BS-ISO-16700-TC Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

BS-ISO-16700-TC - 2016 EDITION - CURRENT


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Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

Keywords

Calibration;Magnification;Electron optics;Electron microscopes;Microscopes;Optical instruments;Scanning electron microscopes;Control samples;Optical phenomena;Accuracy;Electron beams

To find similar documents by classification:

37.020 (Optical equipment Including microscopes, telescopes, binoculars, optical materials, optical components and optical systems Ophthalmic equipment, see 11.040.70 Optical measuring instruments, see 17.180.30 Photographic equipment lenses, see 37.040.10)

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Document Number

BS ISO 16700:2016 - TC

Revision Level

2016 EDITION

Status

Current

Publication Date

Feb. 26, 2020

Page Count

58

ISBN

9780539107159

Committee Number

CII/9