BS-ISO-22415 › Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
BS-ISO-22415
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2019 EDITION
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CURRENT
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Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
Keywords
Surfaces;Chemical analysis and testing;Definitions;Vocabulary;Surface properties;Spectroscopy
To find similar documents by classification:
71.040.40 (Chemical analysis Including analysis of gases and surface chemical analysis)
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Document Number
BS ISO 22415:2019
Revision Level
2019 EDITION
Status
Current
Publication Date
May 14, 2019
Page Count
38
ISBN
9780580989087
International Equivalent
ISO 22415
Committee Number
CII/60