BS-ISO-24173 › Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
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Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
Keywords
Electron beams;Microanalysis;Test specimens;Orientation;Measurement;Diffraction;Chemical analysis and testing;Crystallography;Crystal structure;Electron microscopes
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Document Number
BS ISO 24173:2024
Revision Level
2024 EDITION
Status
Current
Publication Date
Feb. 19, 2024
Replaces
BS ISO 24173:2009
Page Count
50
ISBN
9780539173741
International Equivalent
ISO 24173
Committee Number
CII/9