DESC-DWG-5962-91726 › Microcircuit, Digital, Bipolar CMOS, Scan Test Device with Octal Buffer, Three-State Outputs, Monolithic Silicon
Microcircuit, Digital, Bipolar CMOS, Scan Test Device with Octal Buffer, Three-State Outputs, Monolithic Silicon
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Document Number
91726C
Revision Level
REVISION C
Status
Current
Publication Date
Dec. 17, 2021
Page Count
22 pages