DESC-DWG-5962-94672 › Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Universal Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monlithic Silicon
Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Universal Bus Transceiver, Three-State Outputs, TTL Compatible Inputs, Monlithic Silicon
To find similar documents by Federal Supply Class Code:
FSC 5962 (Microcircuits, Electronic)
Document Number
94672C
Revision Level
REVISION C
Status
Current
Publication Date
Oct. 25, 2023
Page Count
28 pages