DESC-DWG-5962-94698 Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Transceiver and Register, Three-State Outputs and TTL Compatible Inputs, Monolithic Silicon

DESC-DWG-5962-94698 - REVISION B - CURRENT
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Microcircuit, Digital, Advanced Bipolar CMOS, Scan Test Device with 18-Bit Transceiver and Register, Three-State Outputs and TTL Compatible Inputs, Monolithic Silicon


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FSC 5962 (Microcircuits, Electronic)

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Document Number

5962-94698B

Revision Level

REVISION B

Status

Current

Publication Date

June 25, 2015

Page Count

30 pages