EN-60749-30 › Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
Document Number
EN 60749-30:2005
Revision Level
2005 EDITION
Status
Current
Publication Date
March 1, 2005