EN-62047-22 › Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
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Document Number
EN 62047-22:2014
Revision Level
2014 EDITION
Status
Current
Publication Date
Sept. 26, 2014