EN-62374-1 › Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

EN-62374-1 - 2010 EDITION - CURRENT -- See the following: BS-EN-62374-1 DIN-EN-62374-1


Included in this current edition are the following subparts:

 2010 EDITION - Jan. 1, 2010
 2010 EDITION CORRIGENDUM - April 1, 2011


To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

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Document Number

EN-62374-1

Revision Level

2010 EDITION

Status

Current

Publication Date

Jan. 1, 2010