IEC-60748-4-3 › Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)

IEC-60748-4-3 - 1ST EDITION - CURRENT


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Specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics.
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31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

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Document Number

IEC 60748-4-3 Ed. 1.0 en:2006

Revision Level

1ST EDITION

Status

Current

Publication Date

Aug. 1, 2006

Committee Number

47A