IEC-60749-13 Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

IEC-60749-13 - EDITION 2.0 - CURRENT
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IECá60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.áThe salt atmosphere test is considered destructive.
This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).
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Document Number

IEC 60749-13 Ed. 2.0 b:2018

Revision Level

EDITION 2.0

Status

Current

Publication Date

Feb. 1, 2018

Committee Number

47