IEC-60749-28-RL › Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

IEC-60749-28-RL - EDITION 2.0 - CURRENT



Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level


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Document Number

S+ IEC 60749-28 Ed. 2.0 en:2022 (Redline version)

Revision Level

EDITION 2.0

Status

Current

Publication Date

March 1, 2022

Page Count

152 pages