IEC-60749-36 Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

IEC-60749-36 - 1ST EDITION - CURRENT


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Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
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Document Number

IEC 60749-36 Ed. 1.0 b:2003

Revision Level

1ST EDITION

Status

Current

Publication Date

Feb. 1, 2003

Committee Number

47