IEC-61164 › Reliability growth - Statistical test and estimation methods
IEC-61164
-
2ND EDITION
-
CURRENT
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IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:
- addition of two statistical models for reliability growth planning and tracking in the product design phase;
- statistical methods for the reliability growth programme in the design phase of IEC 61014;
- addition of the discrete reliability growth model for the test phase;
- addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;
- addition of real lif examples for most of the statistical models;
- numerical correction of tables in the reliability growth test example. This standard should be used in conjunction with IEC 61014.
To find similar documents by classification:
03.120.01 (Quality in general Including general aspects related to reliability and maintainability)
03.120.30 (Application of statistical methods)
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Document Number
IEC 61164 Ed. 2.0 b:2004
Revision Level
2ND EDITION
Status
Current
Publication Date
March 1, 2004
Committee Number
56