IEC-61967-6-1 › Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

IEC-61967-6-1 - 1ST EDITION AMENDMENT 1 - SUPERSEDED
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Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
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31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

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Document Number

IEC 61967-6 Amd.1 Ed. 1.0 b:2008

Revision Level

1ST EDITION AMENDMENT 1

Status

Superseded

Publication Date

March 12, 2008

Committee Number

47A