IEC-62396-5 › Process management for avionics - Atmospheric radiation effects - Part 5: Guidelines for assessing thermal neutron fluxes and effects in avionics systems
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IEC TS 62396-5:2008 (E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. Addresses more in detail the following: detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners; an enhanced compilation of the thermal neutron SEU cross section in currently available SRAM devices (more than 20 different devices).
To find similar documents by classification:
03.100.50 (Production. Production management)
31.020 (Electronic components in general Magnetic components, see 29.100.10)
49.060 (Aerospace electric equipment and systems Including Avionics)
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Document Number
IEC-62396-5
Revision Level
EDITION 1.0
Status
Current
Publication Date
Aug. 1, 2014
Committee Number
107