IEC-62416 Semiconductor devices - Hot carrier test on MOS transistors

IEC-62416 - EDITION 1.0 - CURRENT


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IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
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31.080 (Semiconductor devices Semiconducting materials, see 29.045)

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Document Number

IEC 62416 Ed. 1.0 b:2010

Revision Level

EDITION 1.0

Status

Current

Publication Date

April 1, 2010

Committee Number

47