IEC-62483 Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices

IEC-62483 - EDITION 1.0 - CURRENT


Document Center Inc. is an authorized dealer of IEC standards.
The following bibliographic material is provided to assist you with your purchasing decision:


IEC 62483 2013 describes the methodology applicable for environmental acceptance testing of tin based surface finishes and mitigation practices for tin whiskers on semiconductor devices This methodology may not be sufficient for applications with special requirements i e military aerospace etc Additional requirements may be specified in the appropriate requirements procurement documentation This first edition is based on JEDEC documents JESD201A and JESD22 A121A and replaces IEC PAS 62483 published in 2006 This first edition constitutes a technical revision This edition includes the following significant technical changes with respect to the previous edition br a The content of IEC PAS 62483 was added to the content of JESD201A as Annex A br b A methodology was introduced for environmental acceptance testing of tin based surface finishes and mitigation practices for tin whiskers br c A Clause 6 was introduced detailing the reporting requirements of test results
ORDER

Price:

$281.00        

To find similar documents by classification:

31.080.01 (Semiconductor devices in general)

This document comes with our free Notification Service, good for the life of the document.

This document is available in either Paper or PDF format.

Document Number

IEC 62483 Ed. 1.0 b:2013

Revision Level

EDITION 1.0

Status

Current

Publication Date

Sept. 1, 2013

Committee Number

47